Fluctuation Electron Microscopy of Amorphous Materials: The Twinkle in the Microscopist's Eye.

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• Mike Treacy, Department of Materials, Oxford University
• Thursday 15 July 2010, 16:00-17:00
• Mott Seminar Room, Cavendish Laboratory, Department of Physics.

If you have a question about this talk, please contact Stephen Walley.

Fluctuation Electron Microscopy (FEM) is a hybrid imaging-diffraction technique that examines the fluctuations in diffraction between small sample volumes, 1 – 2 nm wide. In amorphous materials, diffraction signals from such small regions appear speckled and uncorrelated over short distances. Speckle statistics can show deviations from pure diffraction noise, and reveal subtleties about the medium-range order in the sample that is not discernible in the averaged diffraction data. I will describe how the FEM method works, give some examples of its application to amorphous materials, and describe future possibilities.

This talk is part of the Physics and Chemistry of Solids Group series.

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