University of Cambridge > Talks.cam > Optoelectronics Group > Imaging Bulk Heterostructure Blends, Carrier Dynamics and Fluctuations in Bulk Heterostructure Blends and Ferroelectric Polymer Transistors.

Imaging Bulk Heterostructure Blends, Carrier Dynamics and Fluctuations in Bulk Heterostructure Blends and Ferroelectric Polymer Transistors.

Add to your list(s) Download to your calendar using vCal

If you have a question about this talk, please contact Jenny Clark.

Near field scanning optical microscopy (NSOM) along with local photocurrent mapping is a unique technique that provides direct insight into evolution of optoelectronic properties in polymer blends with morphological (2D and 3D) variations.We demonstrate the utility of this method in Si-PCPDTBT/ PC71BM model devices. A steady state photocurrrent response is a net outcome of the various charge generation, transport and loss processes. We study the accompanying fluctuations in the photocurrent which represents the discernible signature of the deviation from a time-independent steady current and attribute it to trapping events. The trapping process involves a capture, waiting and release stages of finite duration with a resulting noise spectrum which can takes a l/f type response in a relevant frequency regime.

This talk is part of the Optoelectronics Group series.

Tell a friend about this talk:

This talk is included in these lists:

Note that ex-directory lists are not shown.

 

© 2006-2020 Talks.cam, University of Cambridge. Contact Us | Help and Documentation | Privacy and Publicity