University of Cambridge > Talks.cam > IET Cambridge Network - Lectures > Making the invisible visible: The nm scale perspective

Making the invisible visible: The nm scale perspective

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The scanning electron microscope (SEM) has been in use in various applications including aircraft engine failure analysis, medical, mining, electron beam nanolithography and semiconductor integrated circuit inspection. This presentation outlines the operation of the scanning electron microscope, innovations to date that enhance the capability of SEM in the various applications mentioned above, example of organisations that use SEM in their production process or R&D and the results that contributed to our daily lives.

This talk is part of the IET Cambridge Network - Lectures series.

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