University of Cambridge > > Quantum Matter Seminar > Synchrotron radiation and beamlines at 3rd generation synchrotrons

Synchrotron radiation and beamlines at 3rd generation synchrotrons

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The deviation of the refractive index from unity, n=1- in the X-ray regime is related to the scattering properties of the medium, mainly the electron density. It will be shown that  is of the order of 10-5 which implies that X-rays will be reflected externally for gracing incident angles below a critical angle. This aspect is used to manufacture focussing devices for X-rays. These main components of a synchrotron beamline are able to focus X-rays down to a few tens of nanometre. Some examples are discussed as well as the principle of a monochromator, another indispensable device for most experiments. The basics of how X-rays are generated by different insertion devices and how the characteristic parameters of a synchrotron might set limits for an experiment are also discussed. This understanding is essential for many experiments to optimize the measurement.

This talk is part of the Quantum Matter Seminar series.

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