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Deformation Pathways in Shock Compressed Silicon: Experiments and Atomic Simulations

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Laser-driven shock compression of silicon has recently exposed a diversity of deformation pathways. In-situ measurements have identified the elastic-plastic transition, partial phase changes, and bulk disordering. Presented here will be a successful effort to recover shocked silicon – post-mortem microscopy shows brittle crack networks, bulk and directional amorphization, as well as extensive partial dislocation activity. Massive atomic simulations help elucidate the important role of shear stress in these processes and the potential connections between them.

This talk is part of the Surfaces, Microstructure and Fracture Group series.

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