Pushing the limits of analytical electron microscopy with data science

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• Francisco de la Pena, Electron Microscopy Group, University of Cambridge
• Tuesday 17 May 2016, 11:00-12:00
• LT Goldsmith 1 Materials Science and Metallurgy, Department of.

If you have a question about this talk, please contact Duncan Johnstone.

Recent instrumentation advances are dramatically increasing the amount and quality of data generated by modern scientific instruments, the electron microscope being no exception. Indeed, in electron microscopy, multi-dimensional and multi-signal experiments are today becoming routine. In this context, novel data analysis methods are posed to have a disruptive role in shaping the immediate future of electron microscopy.

This seminar will discuss some advances in analytical electron microscopy enabled by these developments including quantitative two and three-dimensional analysis of chemical elements, bonding and surface plasmons at the nanoscale. Software plays an increasingly important role in scientific innovation. We will discuss how we are shaping HyperSpy, a multi-dimensional data analysis software package, to address some current challenges in the analysis of electron microscopy datasets.

This talk is part of the Electron Microscopy Group Seminars series.

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