University of Cambridge > Talks.cam > Electron Microscopy Group Seminars > Analysing interfaces in multilayer films using STEM-EELS

Analysing interfaces in multilayer films using STEM-EELS

Add to your list(s) Download to your calendar using vCal

If you have a question about this talk, please contact Dr Jonathan Barnard.

In this presentation I will introduce the technique of scanning transmission electron microscopy electron energy loss spectroscopy (STEM-EELS) for analysis of multilayer thin films. Using examples of high-k dielectric stacks and ferroelectric superlattices I will show that STEM -EELS enables us to probe the chemistry, structure and bonding with high spatial resolution.

This talk is part of the Electron Microscopy Group Seminars series.

Tell a friend about this talk:

This talk is included in these lists:

Note that ex-directory lists are not shown.

 

© 2006-2017 Talks.cam, University of Cambridge. Contact Us | Help and Documentation | Privacy and Publicity