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Nanoscale Patterning and Imaging

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If you have a question about this talk, please contact James Macdonald.

Our final event this year will be held in the Nihon room at Pembroke college on 15th November. Refreshments will be available from 7pm and talks will start at 7.30pm.

We are excited to be hosting two great speakers and hope to see you there!

Dr Taylor Stock, London Centre for Nanotechnology

Atomically Precise Dopant Nanostructures in Silicon: Fabrication and Characterisation Atomically precise placement of individual dopant atoms within a semiconductor crystal lattice represents the ultimate miniaturization of electronic device fabrication. This high precision control of matter has been achieved, and is currently only accessible using scanning tunneling microscopy hydrogen desorption lithography (STM-HDL). Over the past two and a half decades, STM -HDL has been developed to the degree that structures such as a single atom single electron transistor can be successfully fabricated. Atomically precise device fabrication opens a door to the realization of revolutionary new quantum devices, by allowing spatial confinement in all three dimensions, and ultimately, the isolation of individual charges and spins. Further development of this technique aims to increase yield and scale, expand the materials palette, and implement advanced characterisation strategies for rapid throughput and quality control. In this talk, I describe the basic science and technology of STM -HDL for atomic scale device fabrication, and share some recent advances from our research group aimed at introducing additional dopant species, and developing existing and novel characterisation techniques for analysis of dopant nanostructures.

Dr Colm Durkan, Nanoscience Centre, University of Cambridge Nanomechanical Atomic Force Microscopy

Oil-exposed surfaces are susceptible to carbonaceous deposits (CDs). In turn, deposits are responsible for fouling, compromising performance and reducing profitability across the hydrocarbon value chain. An understanding of the deposition behaviour of these organic molecules is imperative in order to tackle this problem. In particular, we will address the question of understanding the deposition in upstream operation, where the CDs are known to be asphaltenes, the heaviest fraction of oil. Systematic characterisation of fouled oil-exposed surfaces constitutes an initial step towards that direction and it is a challenging task in itself. The merits and disadvantages of using Atomic Force Microscopy (AFM) as the characterisation technique of choice are presented, the methodology followed is discussed and relevant results showing the effect of an adhesion inhibitor (AI) on deposition are exhibited. This work provides insights towards an understanding of the deposition behaviour of asphaltenes and encourages the use of the nanomechanical imaging capabilities of the AFM for their characterisation.

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