Abstract

Over the past few years STEM -based electron tomography has become an almost-routine method to examine the 3D structure of materials at the nanoscale. There have been significant advances in terms of optimal acquisition strategies (e.g. sub-sampling and in-painting) and reconstruction algorithms. The adoption of iterative reconstruction techniques and more recently compressed sensing methods has led to greatly improved reconstruction fidelity by incorporating known (prior) information or comparable fidelity using greatly reduced data sets.

Recently, with the introduction of more efficient spectrometers and cameras, and with a vast increase in computer power, analytical electron microscopy / tomography has yielded new quantitative nanoscale information about the crystallography, composition, chemistry and electric, magnetic and optical properties through the acquisition of ‘multi-dimensional’ data sets. This has been accomplished by combining different modes of electron microscopy, exploring real and reciprocal space, energy and time. I will discuss how this is best implemented, reviewing the state-of-the-art in multi-dimensional microscopy and look forward to how these techniques might be developed further for automated data collection and analysis.

This talk will be held online using Zoom. Please register your email address here to receive Zoom links via email.

Workshop website: https://www.mtg.msm.cam.ac.uk/events/msm-aimr-joint-online-workshop-2020