Optimizing spatial resolution and minimizing beam damage in TEM and EELS
- đ¤ Speaker: Ray F. Egerton, Physics Department, University of Alberta, Canada
- đ Date & Time: Monday 15 August 2016, 11:30 - 12:30
- đ Venue: Goldsmiths 1, Lecture room, Dept. of Materials Science and Metallurgy
Abstract
This talk will address 4 factors that determine the spatial resolution of imaging or spectroscopy in the TEM , with particular attention to beam-induced damage and the delocalization of inelastic scattering. In particular, recent advances in monochromator design have made possible the spectroscopy of energy losses below 1 eV. In this regime delocalization severely limits the spatial resolution but provides some relief from radiation damage.
Series This talk is part of the Electron Microscopy Group Seminars series.
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Ray F. Egerton, Physics Department, University of Alberta, Canada
Monday 15 August 2016, 11:30-12:30