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Tuesday 26 February 2008, 15:00-16:00
Analysing interfaces in multilayer films using STEM-EELS
- đ¤ Speaker: David McComb, Imerial College London
- đ Date & Time: Tuesday 26 February 2008, 15:00 - 16:00
- đ Venue: T001 [Tower Seminar Room], Materials Science and Metallurgy, Department of
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Dr Jonathan Barnard
Abstract
In this presentation I will introduce the technique of scanning transmission electron microscopy electron energy loss spectroscopy (STEM-EELS) for analysis of multilayer thin films. Using examples of high-k dielectric stacks and ferroelectric superlattices I will show that STEM -EELS enables us to probe the chemistry, structure and bonding with high spatial resolution.
Series This talk is part of the Electron Microscopy Group Seminars series.
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