BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Talks.cam//talks.cam.ac.uk//
X-WR-CALNAME:Talks.cam
BEGIN:VEVENT
SUMMARY:Precession Electron Diffraction in the Transmission Electron Micro
 scope - Dr Alex Eggeman\, Dept of Materials Science & Metallurgy\, Univers
 ity of Cambridge
DTSTART:20091020T140000Z
DTEND:20091020T150000Z
UID:TALK20515@talks.cam.ac.uk
CONTACT:Dr Jonathan Barnard
DESCRIPTION:There is currently great interest in the use of precession ele
 ctron diffraction for acquiring high quality crystallographic information 
 because of the seeming ability to remove dynamical effects from recorded i
 ntensities\, usually a significant problem for direct structure solution. 
 The precession geometry uses the upper deflectors to  tilt the incident be
 am away from a dynamical zone-axis and then rotate the tilted beam to prod
 uce a hollow-cone of illumination. The lower deflectors then de-scan the p
 recessed beams to recover the original zone-axis geometry. In this way it 
 is possible to reduce the effect of strong coherent multi-beam conditions 
 on the overall diffraction pattern.\n\nThe reduction in dynamical effects 
 in the recorded diffraction intensities has an important role in improving
  the ability of researchers to successfully recover structures.  In additi
 on to this\, there are other useful applications such as gathering point-g
 roup information about a sample and acquiring zone-axis data from beam sen
 sitive samples.\n\nIn this talk I will introduce the historic motivation f
 or precession electron diffraction and go through to show some of our rece
 nt results from known and unknown materials.  In addition I aim to show so
 me of the ways in which we are looking to determine the optimum conditions
  for using precession on a sample and possible avenues for improving it's 
 application.
LOCATION:Pfizer Seminar Room [4th floor]\, Materials Science and Metallurg
 y\, Department of
END:VEVENT
END:VCALENDAR