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SUMMARY:Advances in Label-Free High-Resolution Molecular Imaging using J S
 eries III Cluster SIMS - Naoko Sano\, Ionoptika. Ltd.\, Chandler’s Ford\
 , UK
DTSTART:20260514T140000Z
DTEND:20260514T150000Z
UID:TALK245758@talks.cam.ac.uk
CONTACT:Malvina Constantinou
DESCRIPTION:J Series III Cluster SIMS represents the cutting edge of surfa
 ce analysis\, utilising Secondary Ion Mass Spectrometry (SIMS) with cluste
 r beams as the primary ion beams to provide detailed chemical maps of mate
 rials from biological to semiconductors. The technique needs no matrix and
  probes a few nanometres from the top surface\, especially using Ionoptika
 ’s water  Gas  Cluster Ion Beam (GCIB)\,  enabling sensitivity down to t
 he ppb level for some cases.\nThe J Series III Cluster SIMS with the uniqu
 e "continuous" primary ion beams offers:\n* High Sensitivity: from ppb to 
 ppm levels.\n* High spatial resolution: down to 300 nm beam spot size\n* M
 atrix free\n* 2D and 3D molecular imaging\n* Cryogenic Capabilities\n\nI w
 ill present the use of J Series III Cluster SIMS to investigate the 2D and
  3D structure of a range of materials seen in Ionoptika’s lab including 
 hybrid materials such as perovskite solar cells using the hard ionisation 
 mode (small cluster ion beams) without preferential sputtering effects. I 
 will also introduce novel future applications using Cluster SIMS such as m
 easuring physical property (surface hardness). 
LOCATION:Seminar Room West\, Room A0.015\, Ray Dolby Centre\, Cavendish La
 boratory
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