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SUMMARY:Fluctuation Electron Microscopy of Amorphous Materials: The Twinkl
 e in the Microscopist's Eye. - Mike Treacy\, Department of Materials\, Oxf
 ord University
DTSTART:20100715T150000Z
DTEND:20100715T160000Z
UID:TALK25011@talks.cam.ac.uk
CONTACT:Stephen Walley
DESCRIPTION:Fluctuation Electron Microscopy (FEM) is a hybrid imaging-diff
 raction technique that examines the fluctuations in diffraction between sm
 all sample volumes\, 1 - 2 nm wide. In amorphous materials\, diffraction s
 ignals from such small regions appear speckled and uncorrelated over short
  distances. Speckle statistics can show deviations from pure diffraction n
 oise\, and reveal subtleties about the medium-range order in the sample th
 at is not discernible in the averaged diffraction data. I will describe ho
 w the FEM method works\, give some examples of its application to amorphou
 s materials\, and describe future possibilities.
LOCATION:Mott Seminar Room\, Cavendish Laboratory\, Department of Physics
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