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SUMMARY:Next generation electron detectors for TEM: an introduction - Grig
 ore Moldovan\, Department of Materials\, University of Oxford
DTSTART:20061122T150000Z
DTEND:20061122T160000Z
UID:TALK5961@talks.cam.ac.uk
CONTACT:Edmund Ward
DESCRIPTION:Current imaging systems for TEM place a variety of artificial 
 limitations on efficiency\, resolution\, speed\, dynamic range and field o
 f view. Since these limitation are introduced primarily by the principle o
 f operation of current detectors\, little can be achieved by modifying the
  current cameras. New imaging systems based on new detection concepts are 
 key in overcoming these limitations.\n\nThis seminar aims to introduce the
  main concepts in position sensitive particle detections and to provide an
  overview of the main detection systems in use\, not only in electron micr
 oscopy\, but also in other research areas\, such as particle physics and a
 stronomy. A number of detection systems will be compared\, focusing on str
 ip detectors\, charge coupled devices and active pixel detectors. Direct a
 nd indirect detection\, as well as counting and integration methods will b
 e discussed\, highlighting the advantages and disadvantages of each in rel
 ation with TEM.\n\nExpected improvements in electron detection will be dis
 cussed\, indicating the benefits for a number of TEM-based techniques. It 
 will be shown that noiseless detection with a tremendous improvement in ef
 ficiency is possible\, with great benefits in microscopy of electron sensi
 tive materials\, such as biological molecules and viruses. Detection speed
  will also be discussed\, showing that frame rates in the range of kHz can
  be obtained\, increasing the time resolution in TEM by a few orders of ma
 gnitude. It will also be shown that unlimited dynamic range can be obtaine
 d with new detectors\, bringing significant advantages in quantitative ele
 ctron diffraction and EELS.\n
LOCATION:T001 [Tower Seminar Room]\, Materials Science and Metallurgy\, De
 partment of
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