Goldsmiths 2 & https://zoom.us/j/96836714124
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Bragg Diffraction Imaging Analysis of Crystal Defects in GaN Substrates - Comparison of the growth method and the seed approach
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Dr. Lutz Kirste, Fraunhofer Institute for Applied Solid State Physics (IAF), Freiburg, Germany .
Thursday 01 February 2024, 15:15-16:15